SHARIFA B; UTAMURADOVA, JONIBEK J. KHAMDAMOV, BEKZOD SH. ALIKULOV; KHOJAKBAR S. DALIYEV. FTIR SPECTRUM ANALYSIS OF SILICON DOPED WITH ERBIUM. Research Focus International Scientific Journal, [S. l.], v. 4, n. 11, p. 8–15, 2025. DOI: 10.66073/researchfocus.v4i11.1823. Disponível em: https://refocus.uz/index.php/rf/article/view/1823. Acesso em: 7 aug. 2026.