Sharifa B, Utamuradova, Jonibek J. Khamdamov, Bekzod Sh. Alikulov, and Khojakbar S. Daliyev. “FTIR SPECTRUM ANALYSIS OF SILICON DOPED WITH ERBIUM”. Research Focus International Scientific Journal 4, no. 11 (December 5, 2025): 8–15. Accessed April 23, 2026. https://refocus.uz/index.php/1/article/view/1823.