SHARIFA B; UTAMURADOVA, JONIBEK J. KHAMDAMOV, BEKZOD SH. ALIKULOV; KHOJAKBAR S. DALIYEV. FTIR SPECTRUM ANALYSIS OF SILICON DOPED WITH ERBIUM. Research Focus International Scientific Journal, [S. l.], v. 4, n. 11, p. 8–15, 2025. DOI: 10.66073/10.66073. Disponível em: https://refocus.uz/index.php/1/article/view/1823. Acesso em: 23 apr. 2026.